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FIZIKA A 9 (2000) 2 , 61-66
 
ON USE OF PSEUDO-VOIGT PROFILES IN DIFFRACTION LINE BROADENING ANALYSIS
PRABAL DASGUPTA
Department of C.S.S., Indian Association for the Cultivation of
Science, Jadavpur, Calcutta 700 032, India e-mail : prabaldasgupta@hotmail.com
Received 29 September 1999; revised manuscript received 16 February
2000
Accepted 20 March 2000
Sample-related X-ray diffraction profiles are often fitted with a pseudo-Voigt
function, which is a linear combination of a Cauchy and a Gaussian function, particularly
for the cases of size-strain analysis. This work reveals that Cauchy content, h, must be greater than 0.328 in case of pseudo-Voigt profile,
otherwise one can not expect any meaningful accuracy in terms of data on crystallite size
extracted from such profiles. h values published by several
authors, who have made use of pseudo-Voigt function as profile fitting function, were
thoroughly studied and it was found that their reported h
values agree with the present theory.
PACS numbers: 61.10.-i, 61.14.Dp
UDC 537.874.6, 538.97
Keywords: X-ray diffraction profiles, pseudo-Voigt function
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