SYNCHROTRON X-RAY DIFFRACTION LINE PROFILE

Noncopyrightable U.S. government contribution.

DAVOR BALZAR^a,c, PETER W. STEPHENS^b,d, and HASSEL LEDBETTER^a

^aMaterials Science and Engineering Laboratory, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303, U. S. A.
^bNational Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973, U. S. A.
^cOn leave from X-ray Laboratory, Division of Materials Research and Electronics, Physics Department, Ruđer Bošković Institute, P.O. Box 1016, 10001 Zagreb, Croatia
^dOn leave from Physics Department, State University of New York, Stony Brook,
NY 11794, U. S. A.

Received 31 January 1997

This paper is dedicated to Professor A. Bonefačić on the occasion of his 70^th birthday

We analyse diffraction line profiles obtained at the X3B1 National Synchrotron Light Source powder-diffraction beamline. Calculated diffraction-line widths are compared to the measurements of a National Institute of Science and Technology Standard Reference Material, LaB₆. The discrepancy at high Bragg angles is probably caused by the inadequate Gaussian approximation for the Darwin width of monochromator Bragg reflection. The equatorial-slit width has a major influence not only on vertical (equatorial) divergence but also on the character of diffraction-line profiles at high angles. The least-squares fits of instrument-function deconvoluted tungsten-line profiles show that a Voigt function satisfactorily models physically broadened line profiles.

UDC 538.95
PACS 61.10.-i

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