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FIZIKA A 10 (2001) 1 , 21-30
 
GROWTH AND CHARACTERIZATION OF LEAD-SULFIDE FILMS DEPOSITED ON GLASS
SUBSTRATES
SIHAM MAHMOUD and OMAR HAMID
Physics Department, National Research Centre, Cairo, Egypt
Received 31 March 2000; revised manuscript received 3 November 2000
Accepted 7 May 2001
Lead-sulfide (PbS) films have been deposited by chemical deposition method on glass
substrates. The details of the preparation method are described. The advantage of this
method is simple, relatively inexpensive and easily controlled method that is producing
large-area films. Some data about the electrical properties, structure, composition of the
films and thermal stability of the powder samples are also presented. The structure and
crystallite sizes were determined by X-ray diffraction studies. The films are very
adherent to the substrates. The films are polycrystalline and average crystallite sizes
are 15 nm. The surface morphology of the as-deposited and heated films was studied with a
scanning electron microscope. The rate of deposition and terminal thickness have been
determined. Hall measurements were performed at room temperature for films deposited on
glass substrate to determine the carrier density, Hall mobility and the mean free path of
the carriers.
PACS numbers: 73.61.Jc
UDC 538.975
Keywords: PbS films, chemical deposition method, structure, composition,
thermal stability, crystallite sizes, carrier density, Hall mobility, mean free path of
the carriers
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