FIZIKA A 4  (1995) 2, 137-148

COINCIDENCE TECHNIQUES IN ATOMIC AND SURFACE ANALYSIS SPECTROSCOPY

JOHN L. ROBINS
Department of Physics, The University of Western Australia, Nedlands, Perth, W.A. 6907 Australia

Received 7 April 1995

The information obtainable from electron and X-ray spectroscopy studies can be increased significantly by the use of coincidence techniques. This entails detecting pairs of electrons and/or photons which are scattered or emitted from the same interaction event. This is illustrated by reference to Auger photoelectron coincidence spectroscopy. Some of the techniques currently being developed for enhancing the collection and display of coicidence data in atomic analysis spectroscopy are described. These include the use of microchannel plates and position sensitive detectors to provide parallel data collection of coincidence measurements. These can offer at least two orders of magnitude reduction in data collection time and lead to both energy dispersive and momentum dispersive displays in (e,2e) analyses. The possibility of using these procedures for surface and thin film analysis is discussed.

UDC 538.975
PACS 73.20.-r

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