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FIZIKA A 4 (1995) 2, 255-261
 
PREPARATION AND CHARACTERIZATION OF C60/C70+Ni
POLYCRYSTALLINE THIN FILM GROWN ON DIFFERENT SUBSTRATES
ELZHIETA CZERWOSZ*, PRZEMYSTAW BYSZEWSKI*+, PIOTR
DLUZEWSKI+, HALINA WRONKA*, RYSZARD DIDUSZKO*, JOANNA
RADOMSKA*
and MIROSTAW KOZLOWSKI*
*Institute of Vacuum Technology, 00-241 Warsaw, Dluga 44/50, Poland
+Institute of Physics, Polish Academy of Sciences, 02-628 Warsaw, al. Lotnikow
32/46, Poland
Received 7 April 1995
Revised manuscript received 14 June 1995
C60/C70 + Ni films were obtained by thermal evaporation method in
a wide range of Ni concentration (from 1.5 to 10 wt. %). The polycrystalline structure was
detected in layers with Ni concentration of 1.5 wt. %. For this Ni concentration, growth
of grains in columnar form was observed by SEM. TEM examination showed existence of
crystalline grains of a size of a few micrometers and 10 - 200 nm thick. The electron and
X-ray diffraction exhibited Bragg distances of approx. 0.87, 0.83, 0.50 and 0.32 nm, and
in electron diffraction 1.0, 0.76 and 0.65 nm interplanar distances were found. In Raman
spectra, typical fullerenes and two other bands placed at 580 and 1100 cm-1
were observed. The intensity of the latter bands depends on Ni concentration. For Ni
concentration higher then 1.5 wt. %, the degradation of fullerene structure was observed
by HRTEM, electron and X-ray diffraction.
UDC 538.975
PACS 68.55.-a
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