FIZIKA B 4 (1995) 2, 127-135

COMPTON BACKSCATTERING OF Hf K X-RAYS IN GERMANIUM

SELIM PAŠIĆ^* and KSENOFONT ILAKOVAC^*,#
*Department of Physics, Faculty of Science, University of Zagreb, P. O. Box 162, HR-10001 Zagreb, Croatia
^#Ruđer Bošković Institute, P. O. Box 1016, 10001 Zagreb, Croatia

Received 1 August 1995

The differential cross section, d²s/dWdE, for Compton scattering in germanium was measured by observing detector-to-detector scattering using the coincidence method. The experiment was performed at incident energies of 55.791 and 54.612 keV and scattering angle of J = 180^°. The method applied is compared with the corresponding measurements in the singles mode, i.e. using the source-scatterer-detector assembly. We found that the coincidence method yields better results, especially in the region below the peak due to scattering on weakly bound electrons. However, it is restricted to the investigation of Compton scattering in detector materials. Experimental results are compared with theoretical calculations based on the "A²-Born" and the impulse approximations.

UDC 539.172
PACS 32.80.Cy, 35.80.+s

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